Microbolometer bad pixel and cluster definitions through defect observations

Stephen D. Burks; David P. Haefner; Brian P Teaney; Colin Rakes

doi:10.1117/12.2662156

14 June 2023 Microbolometer bad pixel and cluster definitions through defect observations

Stephen D. Burks, David P. Haefner, Brian P Teaney, Colin Rakes

Proceedings Volume 12533, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXIV; 1253307 (2023) https://doi.org/10.1117/12.2662156
Event: SPIE Defense + Commercial Sensing, 2023, Orlando, Florida, United States

Abstract

Specifications for microbolometer defective detector pixel outages, cluster sizes, and row/column outages are common for many electro-optical imaging programs. These specifications for bad pixels and clusters often do not take into account the user’s ability to perceive the lack of information from areas of a focal plane with outages that are replaced using substitution algorithms. This is because the defective pixels are typically specified as a sensor parameter and does not take into account a camera’s system level descriptors: modulation transfer function (MTF), outage substitution strategy, post processing MTF, display performance, and observer’s psychophysical performance. These parameters combine to determine the total system MTF, which can be used to determine the minimum resolution at which a replaced pixel or cluster can be observed. This study analyzes different defective pixel specifications and their visibility from the system level descriptors and proposes specifications that are better aligned to camera performance.

Conference Presentation

Citation Download Citation

Stephen D. Burks, David P. Haefner, Brian P Teaney, and Colin Rakes "Microbolometer bad pixel and cluster definitions through defect observations", Proc. SPIE 12533, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXIV, 1253307 (14 June 2023); https://doi.org/10.1117/12.2662156

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