Silux: a unit of silicon detector-weighted irradiance

A. Richards; M. Hübner

doi:10.1117/12.2663668

14 June 2023 Silux: a unit of silicon detector-weighted irradiance

A. Richards, M. Hübner

Proceedings Volume 12533, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXIV; 125330J (2023) https://doi.org/10.1117/12.2663668
Event: SPIE Defense + Commercial Sensing, 2023, Orlando, Florida, United States

Abstract

We propose a new unit of irradiance which is geared towards the recent class of low-light silicon CMOS imaging detectors based on high rho, deeply depleted bulk material with significantly increased NIR responsivity; devices intended as potential substitutes for image intensifier tubes in night vision devices. This unit is called silux, a portmanteau of silicon and lux. The authors previously created a unit of irradiance called swux, a portmanteau of SWIR (shortwave infrared) and lux. Swux, which is currently in use in industry, is spectrally weighted by the response of lattice-matched indium gallium arsenide. A silux meter will act like a single giant CMOS imaging sensor (CIS) camera pixel. A standard silux unit and optometers calibrated in silux units will enable engineers and technicians to measure ambient lighting conditions in an unambiguous manner, enabling the comparison of performance for different cameras under different lighting conditions, since the silux unit, combined with a knowledge of the specifications of the optics and the sensor, can be used to directly predict the number of photoelectrons/second/pixel. The silux spectral response function Silux(λ) ranges from 350nm to 1100nm. The authors present the implementation of a silux meter based on a novel silux shaping filter design used in combination with available high-sensitivity Si-diode irradiance sensors to yield the silux spectral response function, thus enabling easy deployment of a standard silux measurement setup in every lab. First measurements from two implemented silux meters will be presented.

Conference Presentation

Citation Download Citation

A. Richards and M. Hübner "Silux: a unit of silicon detector-weighted irradiance", Proc. SPIE 12533, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXIV, 125330J (14 June 2023); https://doi.org/10.1117/12.2663668

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