Long-range nanosecond pulsed laser damage of CMOS cameras

Chengmin Lei; Feng Zhou; He Chen; YaoYao Ma

doi:10.1117/12.2651519

23 January 2023 Long-range nanosecond pulsed laser damage of CMOS cameras

Chengmin Lei, Feng Zhou, He Chen, YaoYao Ma

Proceedings Volume 12557, AOPC 2022: Optical Sensing, Imaging, and Display Technology; 1255718 (2023) https://doi.org/10.1117/12.2651519
Event: Applied Optics and Photonics China 2022 (AOPC2022), 2022, Beijing, China

Abstract

The work concerning the laser-induced damage under long-range (km-class) outdoor testing is very limited due to the difficult, laborious and time-consuming process. In this paper, we demonstrate a 1.5 km outdoor experiment of observing the laser-induced damage of CMOS imaging sensor and predicting the required pulse energy at other propagation lengths and visibility conditions theoretically. The outdoor experiment verifies that large amount of pixel permanent damage on a commercial visible-band CMOS camera can be produced by using the 532 nm pulsed laser with an output energy of higher than 50 mJ at a propagation range of 1.5 km and the atmospheric visibility of 10km. Meanwhile, the laser power density travelling through turbulent atmosphere is estimated theoretically by using a phase screen model. The required laser energy to damage the sensor for different propagation length or visibility condition could be predicted. The simulation results indicates that the atmospheric effects lead to significant impact to the spatial profile of laser beams at long propagation range, which should be considered and analyzed delicately when one is designing a laser countermeasure device.

Citation Download Citation

Chengmin Lei, Feng Zhou, He Chen, and YaoYao Ma "Long-range nanosecond pulsed laser damage of CMOS cameras", Proc. SPIE 12557, AOPC 2022: Optical Sensing, Imaging, and Display Technology, 1255718 (23 January 2023); https://doi.org/10.1117/12.2651519

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