Presentation + Paper
15 August 2023 Microsphere-assisted microscopy: challenges and opportunities
Author Affiliations +
Abstract
Optical microscopy is one the oldest and most widely used techniques for sample inspection in life and material sciences. Microsphere-assisted microscopy (MAM) has emerged as a simple yet efficient approach to boost the spatial resolution. MAM uses a microsphere, placed in the immediate vicinity of the object, to enhance the numerical aperture and improve the resolution. MAM can be used in conjunction with white-light, wide-field, bright-field, dark-field, confocal, fluorescent, second harmonic generation, two-photon, interferometric, and digital holographic microscopies. It can be employed in reflection and transmission modes. There are several open questions and challenges associated with MAM, including the resolution limit, the mechanism behind resolution improvement, and the limited imaging field-of-view. Here, we present the progress in MAM in the past decade along with the associated opportunities and challenges.
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Arash Darafsheh and Vahid Abbasian "Microsphere-assisted microscopy: challenges and opportunities", Proc. SPIE 12618, Optical Measurement Systems for Industrial Inspection XIII, 126180L (15 August 2023); https://doi.org/10.1117/12.2681499
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KEYWORDS
Microspheres

Microscopy

Resolution enhancement technologies

Digital holography

Image resolution

Imaging systems

Spatial resolution

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