Presentation + Paper
15 August 2023 An infrared optical sensor for quantitative inline inspection of nanocoatings on plastic products
Benedikt Hauer, Adrian D. Dorfschmidt, Friederike Münch, Jens Scherer, Daniel Carl
Author Affiliations +
Abstract
We developed a fast infrared sensor to quantify the film thickness of industrially applied SiOx or AlOx plasma coatings on non-flat polymer substrates at production speed. Its underlying physical principle is comparable to infrared reflection absorption spectroscopy (IRRAS) at selected, fixed wavelengths. The coating materials can be measured via their specific phononic absorption bands in the infrared spectral range. In this paper, we demonstrate the functionality of our sensor on actual packaging materials to showcase its aptitude for industrial inline inspection. Furthermore, we discuss a possible extension of our sensor to enable spectroscopic measurements using a tunable Fabry-Pérot filter.
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Benedikt Hauer, Adrian D. Dorfschmidt, Friederike Münch, Jens Scherer, and Daniel Carl "An infrared optical sensor for quantitative inline inspection of nanocoatings on plastic products", Proc. SPIE 12618, Optical Measurement Systems for Industrial Inspection XIII, 126181L (15 August 2023); https://doi.org/10.1117/12.2673229
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KEYWORDS
Film thickness

Infrared radiation

Sensors

Inspection

Polymers

Plasma

Reflection

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