Paper
1 June 2023 Research on intelligent fault diagnosis of equipment based on deep learning and knowledge graph
Junqin Shi, Feng Chen
Author Affiliations +
Proceedings Volume 12625, International Conference on Mathematics, Modeling, and Computer Science (MMCS2022); 126251O (2023) https://doi.org/10.1117/12.2670335
Event: International Conference on Mathematics, Modeling and Computer Science (MMCS2022),, 2022, Wuhan, China
Abstract
In the running state of equipment, the accurate discovery and diagnosis of existing problems is an effective means to ensure the quality and benefit of system operation. Therefore, by using deep learning and knowledge mapping in practical exploration, researchers of various countries have put forward an intelligent fault diagnosis method based on multi-modal information of equipment, which can not only discover the hidden problems within the system in time, but also put forward effective prevention countermeasures based on the diagnosis of problems. In this paper, after understanding the knowledge graph technology and deep learning concept, a corresponding system model was constructed by extracting and integrating the collected multi-modal data information and referring to doctors' diagnosis and treatment process of patients. The final experimental results show that the system can diagnose the equipment autonomously and effectively improve the efficiency of daily management of the system.
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Junqin Shi and Feng Chen "Research on intelligent fault diagnosis of equipment based on deep learning and knowledge graph", Proc. SPIE 12625, International Conference on Mathematics, Modeling, and Computer Science (MMCS2022), 126251O (1 June 2023); https://doi.org/10.1117/12.2670335
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KEYWORDS
Deep learning

Intelligence systems

Machine learning

Detection and tracking algorithms

Inspection

Semantics

Databases

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