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5 October 2023 Particulate contamination on starshade optical edges
Dylan McKeithen, Stuart B. Shaklan, Joshua Vawdrey
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Proceedings Volume 12680, Techniques and Instrumentation for Detection of Exoplanets XI; 1268011 (2023) https://doi.org/10.1117/12.2677571
Event: SPIE Optical Engineering + Applications, 2023, San Diego, California, United States
Abstract
The optical edges of a starshade define its outermost perimeter. During astronomical measurements, the edges are exposed to sunlight resulting in glint seen by the telescope. Clean, sharply etched edges are capable of meeting the stringent solar glint scatter requirement. We report on the increased glint that arises from particulate contamination clinging to the edges. We measure the relationship between surface contamination and edge contamination and compare to a simple edge contaminant population model where the edge acts like a line drawn across the continuous surface. We correlate the level of edge contamination to the degree of increased scatter and derive an on-orbit contamination requirement that is compatible with the detection of exo-Earths.
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(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.
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Dylan McKeithen, Stuart B. Shaklan, and Joshua Vawdrey "Particulate contamination on starshade optical edges", Proc. SPIE 12680, Techniques and Instrumentation for Detection of Exoplanets XI, 1268011 (5 October 2023); https://doi.org/10.1117/12.2677571
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KEYWORDS
Contamination
Metals
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