Analysis of integrated circuit radiation emission measurement: TEM cell and wideband TEM cell method

Yifu Ding; Jie Zhang; Yujie Zhang; Jiandong Guo

doi:10.1117/12.3004561

25 September 2023 Analysis of integrated circuit radiation emission measurement: TEM cell and wideband TEM cell method

Yifu Ding, Jie Zhang, Yujie Zhang, Jiandong Guo

Proceedings Volume 12788, Second International Conference on Energy, Power, and Electrical Technology (ICEPET 2023); 127883C (2023) https://doi.org/10.1117/12.3004561
Event: Second International Conference on Energy, Power, and Electrical Technology (ICEPET 2023), 2023, Kuala Lumpur, Malaysia

Abstract

With the rapid development of integrated circuits, its electromagnetic compatibility becomes more and more prominent. This paper gives the most commonly used test standards and methods of electromagnetic emission, electromagnetic immunity and pulse immunity at home and abroad. In addition, from the aspects of test equipment, test conditions, test arrangement and test procedures, the TEM cell method and wideband TEM cell method of integrated circuit radiation emission measurement are introduced in detail. Suggestions on the use of two testing methods are given. The actual test results measured by this test method are analyzed. According to the actual test experience, this paper briefly introduces the differences between TEM cell method and wideband TEM cell method and stripline method, and gives the test points for attention.

(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Yifu Ding, Jie Zhang, Yujie Zhang, and Jiandong Guo "Analysis of integrated circuit radiation emission measurement: TEM cell and wideband TEM cell method", Proc. SPIE 12788, Second International Conference on Energy, Power, and Electrical Technology (ICEPET 2023), 127883C (25 September 2023); https://doi.org/10.1117/12.3004561

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