Far-field and near-field spectroscopic characterization of Nb2CTx MXene

Kevin Kim; Camilo Pérez de la Vega; Youssef El Helou; Enora Vuillermet; Kuan-Ting Wu; Jérémy Mallet; Aurélien Bruyant

doi:10.1117/12.3009437

12 March 2024 Far-field and near-field spectroscopic characterization of Nb₂CT_x MXene

Kevin Kim, Camilo Pérez de la Vega, Youssef El Helou, Enora Vuillermet, Kuan-Ting Wu, Jérémy Mallet, Aurélien Bruyant

Proceedings Volume 12888, 2D Photonic Materials and Devices VII; 1288808 (2024) https://doi.org/10.1117/12.3009437
Event: SPIE OPTO, 2024, San Francisco, California, United States

Abstract

The Nb₂CT_x MXene was synthesized and optically characterized utilizing Photo-induced Force Microscopy (PiFM), a nanoscale imaging technique combining AFM topography mapping and infrared spectroscopy. In both bulk and single/few layered MXene flakes, absorption peaks were observed in the 770 - 1860 cm^-1 investigated range. The local IR spectra is compared with broader Fourier-transform infrared (FTIR) and Raman spectroscopy to analyse the material composition. Our findings notably highlight the presence of a characteristic peaks related to surface functional group in both far-field and near-field measurement. The spectra also indicate a strong contribution of niobium oxide in the synthetized material.

Conference Presentation

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Kevin Kim, Camilo Pérez de la Vega, Youssef El Helou, Enora Vuillermet, Kuan-Ting Wu, Jérémy Mallet, and Aurélien Bruyant "Far-field and near-field spectroscopic characterization of Nb₂CT_x MXene", Proc. SPIE 12888, 2D Photonic Materials and Devices VII, 1288808 (12 March 2024); https://doi.org/10.1117/12.3009437

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