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With the advancements in technologies such as space optical communication, laser radar, and holographic projection, there has been an increasing demand for beam scanning devices that possess stronger seismic resistance, higher robustness, greater integration, and faster scanning speeds. Focal plane switch beam scanners based on silicon photonics integration technology offer the ability to achieve on-chip beam selection and off-chip scanning. These scanners provide advantages such as smaller size, faster scanning speeds, easier control of optical path selection, and a fully solid-state design without mechanical structures. In terms of scanning dimensions, they can be categorized into one-dimensional (θ) and two-dimensional (θ, φ) scans. Expanding the dimensionality is crucial in order to fulfill the system's functions more effectively. However, most on-chip two-dimensional beam scanners currently available impose higher demands on the light source and power consumption due to their reliance on wavelength tuning of the laser source for angle changes in the second dimension. Furthermore, the minimum control number for N switches is log2N. In this paper, we present a novel two-dimensional beam scanner structure that enables the two-dimensional beam scanning without wavelength tuning of the laser source. Moreover, the maximum control number for N switches in our proposed structure is only 2 for optical path control. The configuration of this structure employs a cross-bar design to achieve these goals. We experimentally verified the performance of a 4x6 array structure, which exhibits a far-field beam divergence angle of 0.06°, a field of view ranging from 4.12°x1.69°, and a background noise suppression of 12.29dB. This on-chip two-dimensional beam scanner offers a simpler structure, lower control complexity, lesser power consumption, and wider application prospects.
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