Paper
7 August 2024 Super-resolution reconstruction based on improved diffusion probabilistic model
Hengrui Zheng, Chenhui Shi, Lichan Zhou, Yuqing Yang
Author Affiliations +
Proceedings Volume 13229, Seventh International Conference on Advanced Electronic Materials, Computers, and Software Engineering (AEMCSE 2024); 1322914 (2024) https://doi.org/10.1117/12.3038185
Event: Seventh International Conference on Advanced Electronic Materials, Computers, and Software Engineering (AEMCSE 2024), 2024, Nanchang, China
Abstract
Despite deep learning models have made significant breakthroughs in the magnification and precision of single image super-resolution (SISR) reconstruction. However, current methods which focus on extracting rich texture details, always ignores the influence of byproduct of artifacts in high factor super-resolution construction. Therefore, a super-resolution method based on improved diffusion probabilistic model (DPM) is proposed to eliminate artifacts while obtain texture details. Firstly, residual skip path (ResPath) is designed to enhance the constrain of initial information on the reconstruction result to mitigate artifacts. In addition, overfitting may also generate artifacts, so blueprint separable convolution (BSConv) is introduced to reduce redundant network parameters. Secondly, in order to retain the texture details, the efficient channel attention (ECA) block and the enhanced spatial attention (ESA) block are incorporated to extract more comprehensive channel and spatial implicit information. The effectiveness of this method is verified on 4 public datasets with ×8 factor. Compared with other advanced SISR methods, the proposed method achieves the best performance on perceptual index (PI) and visual perceptual quality.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Hengrui Zheng, Chenhui Shi, Lichan Zhou, and Yuqing Yang "Super-resolution reconstruction based on improved diffusion probabilistic model", Proc. SPIE 13229, Seventh International Conference on Advanced Electronic Materials, Computers, and Software Engineering (AEMCSE 2024), 1322914 (7 August 2024); https://doi.org/10.1117/12.3038185
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KEYWORDS
Image restoration

Image quality

Diffusion

Super resolution

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