Scatter from subsurface defects and contaminants

John C. Stover; Douglas E. McGary

doi:10.1117/12.22648

1 December 1990 Scatter from subsurface defects and contaminants

John C. Stover, Douglas E. McGary

Proceedings Volume 1331, Stray Radiation in Optical Systems; (1990) https://doi.org/10.1117/12.22648
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

The Rayleigh Rice vector perturbation theory of diffraction is used to relate surface topography to scatter. In fact, this relationship allows the calculation of common surface roughness parameters (power spectrum, rms roughness, average surface wavelength, etc.) from the BRDF under the conditions that the surface is smooth, clean and front surface reflective. The theory can also be used to predict situations where the topography of such a surface will produce no scatter. That is, surface scatter can be eliminated under certain combinations ofviewing parameters. Under these conditions, the measured BRDF is the result of contaminants and subsurface defects. This paper presents previously unpublished material, discusses the theoretical basis for the effect, and gives experimental results.

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John C. Stover and Douglas E. McGary "Scatter from subsurface defects and contaminants", Proc. SPIE 1331, Stray Radiation in Optical Systems, (1 December 1990); https://doi.org/10.1117/12.22648

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KEYWORDS

Dielectric polarization

Light scattering

Bidirectional reflectance transmission function

Receivers

Surface finishing

Polarization

Scatter measurement

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