Paper
1 October 1991 Instrument design and test results of the new all-reflection spatial heterodyne spectrometer
Brett C. Bush, Daniel M. Cotton, James S. Vickers, Supriya Chakrabarti
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Abstract
An all-reflection spatial heterodyne spectrometer (SHS) has been recently developed. The advantages over conventional high-resolution grating spectrometers are that the SHS requires no mechanical scanning, a self-compensating optical design permits easy alignment, and it is much smaller than other spectrometers of comparable resolution. Since all beam-splits and recombinations occur by reflection off of a diffraction grating, the interferometer is capable of operating well into the extreme ultraviolet (EUV) and possibly into the soft X-ray region. A description of the design and the characteristics of the instrument is presented. Also, test results, including sample interferograms as well as their Fourier-transformed spectra, at both visible and UV wavelengths are shown. Finally, we report on future developments and possible applications.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Brett C. Bush, Daniel M. Cotton, James S. Vickers, and Supriya Chakrabarti "Instrument design and test results of the new all-reflection spatial heterodyne spectrometer", Proc. SPIE 1549, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy II, (1 October 1991); https://doi.org/10.1117/12.48354
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KEYWORDS
Diffraction gratings

Interferometers

Spectroscopy

Mirrors

X-ray astronomy

Extreme ultraviolet

Sensors

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