Photometric accuracy of FTIR spectrometers

Markus I. Flik; Z. M. Zhang

doi:10.1117/12.56347

1 March 1992 Photometric accuracy of FTIR spectrometers

Markus I. Flik, Z. M. Zhang

Proceedings Volume 1575, 8th Intl Conf on Fourier Transform Spectroscopy; (1992) https://doi.org/10.1117/12.56347
Event: Eighth International Conference on Fourier Transform Spectroscopy, 1991, Lubeck-Travemunde, Germany

Abstract

High photometric accuracy is essential for precise measurements of optical properties. The effect of source radiation power on the photometric accuracy is a mechanism of growing importance, since modern FTIR spectrometers possess strong sources for high signal-to-noise ratio. A related problem is radiation incident on the detector from a high-temperature sample. This paper presents an analysis of the photometric error in the reflectance measurements for samples at high temperatures. The maximum temperature that can be investigated as a function of the required photometric accuracy is determined for several dielectric crystals and film- substrate composites.

Citation Download Citation

Markus I. Flik and Z. M. Zhang "Photometric accuracy of FTIR spectrometers", Proc. SPIE 1575, 8th Intl Conf on Fourier Transform Spectroscopy, (1 March 1992); https://doi.org/10.1117/12.56347

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