Experimental and theoretical investigation of surface- and bulk-induced attenuation in solution-deposited waveguides

Ronald L. Roncone; James J. Burke; Lori Weisenbach; Brian J.J. Zelinski

doi:10.1117/12.50197

1 November 1991 Experimental and theoretical investigation of surface- and bulk-induced attenuation in solution-deposited waveguides

Ronald L. Roncone, James J. Burke, Lori Weisenbach, Brian J.J. Zelinski

Author Affiliations +

Proceedings Volume 1590, Submolecular Glass Chemistry and Physics; (1991) https://doi.org/10.1117/12.50197
Event: OE Fiber, 1991, Boston, MA, United States

Abstract

Experimental measurement of modal attenuation in solution-derived Si02-Ti02 waveguides is compared to the total waveguide attenuation predicted by surface and volume scattering models. The surface scatter model utilizes measurements of the film index and thickness, and the rms roughness and correlation lengths (measured by Atomic Force Microscopy) of the film and substrate surfaces, to facilitate a realistic comparison of theoretical and experimental waveguide attenuation. Theoretical attenuation, calculated by means of a perturbation technique, in conjunction with a stationary phase method, is used to demonstrate the influence of the most important waveguide and microstructural parameters. The plots provide guidelines for acceptable surface roughness and bulk refractive index fluctuations to fabricate low- loss waveguides. Volume-induced scattering is shown to be the dominant loss mechanism in these waveguides.

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Ronald L. Roncone, James J. Burke, Lori Weisenbach, and Brian J.J. Zelinski "Experimental and theoretical investigation of surface- and bulk-induced attenuation in solution-deposited waveguides", Proc. SPIE 1590, Submolecular Glass Chemistry and Physics, (1 November 1991); https://doi.org/10.1117/12.50197

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