Tunable diode IRRAS study of CO on Pt(111)

Henry W. White; L. F. Sutcu; Jeffrey L. Wragg

doi:10.1117/12.59292

14 May 1992 Tunable diode IRRAS study of CO on Pt(111)

Henry W. White, L. F. Sutcu, Jeffrey L. Wragg

Proceedings Volume 1636, Applied Spectroscopy in Materials Science II; (1992) https://doi.org/10.1117/12.59292
Event: OE/LASE '92, 1992, Los Angeles, CA, United States

Abstract

Tunable diode laser spectroscopy offers unique advantages for high resolution infrared reflection absorption spectroscopy (IRRAS) studies of monolayers on single crystal surfaces. Its greatest potentials lie in analyses of lineshapes less than 1 cm (FWHM), for resolving narrow features on absorption peaks, and for in situ solid-liquid interfacial studies, where high intensity is often required. Other IRRAS techniques introduce instrumental broadening sufficient to create considerable uncertainty in the intrinsic linewidth of very narrow peaks, and can mask sharp features. Using isolated or single mode output from a diode laser source provides resolution of iO3 cm, and thereby eliminates the need for instrumental deconvolution. However, the signal-to-noise (SIN) ratio is generally lower for spectra obtained with diode sources than with Fr-JR techniques, so that the most important applications using diode lasers have been studies of strong scatterers, such as CO on Pt(1 1 1). For this study, linewidths were measured for the C-O stretch mode for the ontop site of CO adsorbed at saturation coverage on a Pt(1 1 1) single crystal using diode laser sources. The measured linewidth at 100 K, using isolated modes, was 2.3 0.3 cm. The linewidth at 0 K was estimated to be 2.0 0.4 cm from variation of linewidths with temperature. Using the uncertainty principle, the 0 K linewidth corresponds to a lifetime of 2.7 0.6 ps, in reasonable agreement with recent lifetime measurements using time-resolved techniques.

Citation Download Citation

Henry W. White, L. F. Sutcu, and Jeffrey L. Wragg "Tunable diode IRRAS study of CO on Pt(111)", Proc. SPIE 1636, Applied Spectroscopy in Materials Science II, (14 May 1992); https://doi.org/10.1117/12.59292

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available