Simplified analysis of the readout waveform for an elliptical mark

Takaya Tanabe; Yasuaki Tanaka; Ryoichi Arai

doi:10.1117/12.137542

13 August 1992 Simplified analysis of the readout waveform for an elliptical mark

Takaya Tanabe, Yasuaki Tanaka, Ryoichi Arai

Proceedings Volume 1663, Optical Data Storage; (1992) https://doi.org/10.1117/12.137542
Event: Optical Data Storage Topical Meeting, 1992, San Jose, CA, United States

Abstract

A new, simplified readout waveform equation for an elliptical mark is analytically derived and confirmed. This approach easily treats an elliptical mark by using an equivalent rectangular mark having (delta) function width and equivalent readout beam spot. The equation is verified by comparison with precise numerical calculations. Good agreement is obtained for practical dimensions of optical recording. The equation gives the characteristics of the readout waveform directly from the elliptical mark.

Citation Download Citation

Takaya Tanabe, Yasuaki Tanaka, and Ryoichi Arai "Simplified analysis of the readout waveform for an elliptical mark", Proc. SPIE 1663, Optical Data Storage, (13 August 1992); https://doi.org/10.1117/12.137542

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