Paper
5 January 1993 High-performance 1040- x 1040-element PtSi Schottky-barrier image sensor
Masafumi Kimata, Naoki Yutani, Natsuro Tsubouchi, Toshiki Seto
Author Affiliations +
Abstract
We have developed a monolithic 1040 X 1040 element PtSi Schottky-barrier infrared image sensor. This device uses the Charge Sweep Device readout architecture with four parallel outputs. The pixel size is 17 X 17 micrometers 2, which is 56% of that of our 512 X 512 element PtSi image sensor. In order to keep sufficient sensitivity with such a small pixel, we have developed a 1.5 micrometers Schottky-barrier process technology and improved the fill factor. The fill factor of this device is 53%. As a result of this improvement, a high differential temperature response of 9.6 X 103 electrons/K and a low noise equivalent temperature difference of 0.1 K have been achieved with f/1.2 optics. We have also improved the saturation characteristics of the device by optimizing the impurity concentrations of the isolation region and guard ring. The saturation level is 1.6 X 106 electrons at a detector reset voltage of 4 V.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Masafumi Kimata, Naoki Yutani, Natsuro Tsubouchi, and Toshiki Seto "High-performance 1040- x 1040-element PtSi Schottky-barrier image sensor", Proc. SPIE 1762, Infrared Technology XVIII, (5 January 1993); https://doi.org/10.1117/12.138975
Lens.org Logo
CITATIONS
Cited by 15 scholarly publications and 1 patent.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Image sensors

Infrared imaging

Infrared sensors

Infrared radiation

Sensors

Thermography

Infrared technology

RELATED CONTENT

Infrared simulation of missile dome heating
Proceedings of SPIE (December 01 1991)
Schottky-Barrier Focal Plane Array Technology
Proceedings of SPIE (April 01 1990)
High-resolution Schottky-barrier infrared image sensor
Proceedings of SPIE (August 12 1992)
Evolution Of Forward Looking Infrared
Proceedings of SPIE (March 12 1982)

Back to Top