Time-series analysis of event-driven evoked potentials

O. H. Stanley M.D.; M.P. J, Wright; A. A. Pike M.D.; N. Marlow M.D.; Edward Roy Pike M.D.

doi:10.1117/12.139041

29 December 1992 Time-series analysis of event-driven evoked potentials

O. H. Stanley M.D., M.P. J, Wright, A. A. Pike M.D., N. Marlow M.D., Edward Roy Pike M.D.

Proceedings Volume 1767, Inverse Problems in Scattering and Imaging; (1992) https://doi.org/10.1117/12.139041
Event: San Diego '92, 1992, San Diego, CA, United States

Abstract

This paper describes a method which aims to identify the stimulus related EEG components which make up the average evoked potential and to obtain confidence intervals for component parameters, such as power and peak amplitude. It is hoped that this will define EEG components that correspond to discrete brain sensory processes and which can be compared between individuals.

Citation Download Citation

O. H. Stanley M.D., M.P. J, Wright, A. A. Pike M.D., N. Marlow M.D., and Edward Roy Pike M.D. "Time-series analysis of event-driven evoked potentials", Proc. SPIE 1767, Inverse Problems in Scattering and Imaging, (29 December 1992); https://doi.org/10.1117/12.139041

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