Chalcogenide glass thin films: Z-Scan measurements of refractive index changes

Francesco Michelotti; Mario Bertolotti; Valentin N. Ciumash; Andrei M. Andriesh

doi:10.1117/12.983231

2 February 1993 Chalcogenide glass thin films: Z-Scan measurements of refractive index changes

Francesco Michelotti, Mario Bertolotti, Valentin N. Ciumash, Andrei M. Andriesh

Author Affiliations +

Proceedings Volume 1773, Photonics for Computers, Neural Networks, and Memories; (1993) https://doi.org/10.1117/12.983231
Event: San Diego '92, 1992, San Diego, CA, United States

Abstract

Nonlinear properties of chacolgenide glass A52S3 thin films have been measured with a self-diffraction (Z-Scan) technique. Photostructural changes and dynamical effects have been measured.

Citation Download Citation

Francesco Michelotti, Mario Bertolotti, Valentin N. Ciumash, and Andrei M. Andriesh "Chalcogenide glass thin films: Z-Scan measurements of refractive index changes", Proc. SPIE 1773, Photonics for Computers, Neural Networks, and Memories, (2 February 1993); https://doi.org/10.1117/12.983231

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