Paper
4 May 1993 Fourier-transform sensitivity analysis of a model of XeCl self-sustained discharge laser
Gianpiero Colonna, Savino Longo, Mario Capitelli
Author Affiliations +
Proceedings Volume 1810, 9th International Symposium on Gas Flow and Chemical Lasers; (1993) https://doi.org/10.1117/12.144639
Event: Ninth International Symposium on Gas Flow and Chemical Lasers, 1992, Heraklion, Greece
Abstract
Sensitivity analysis has been applied to the description of an XeCl laser to analyze how the changes in the kinetic rate coefficients influence the species concentrations.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gianpiero Colonna, Savino Longo, and Mario Capitelli "Fourier-transform sensitivity analysis of a model of XeCl self-sustained discharge laser", Proc. SPIE 1810, 9th International Symposium on Gas Flow and Chemical Lasers, (4 May 1993); https://doi.org/10.1117/12.144639
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Cited by 1 scholarly publication.
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KEYWORDS
Photons

Xenon

Electrons

Chlorine

Gas lasers

Statistical analysis

Chemical lasers

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