Phase-stepping DSPI and its applications

Wen Zheng

doi:10.1117/12.145574

28 May 1993 Phase-stepping DSPI and its applications

Wen Zheng

Proceedings Volume 1821, Industrial Applications of Optical Inspection, Metrology, and Sensing; (1993) https://doi.org/10.1117/12.145574
Event: Applications in Optical Science and Engineering, 1992, Boston, MA, United States

Abstract

The use of phase-stepping technique in speckle interferometry allows a quantitative evaluation of the interference phase with high accuracy and offers the possibility of automated interferogram processing. In this paper, an automated measuring system based on this technique is described. The effects of system parameters on the phase extraction are discussed, some applications in the fields of transient event analysis, in-plane deformation measurement, vibration analysis and nondestructive testing are presented.

Citation Download Citation

Wen Zheng "Phase-stepping DSPI and its applications", Proc. SPIE 1821, Industrial Applications of Optical Inspection, Metrology, and Sensing, (28 May 1993); https://doi.org/10.1117/12.145574

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