Paper
12 May 1993 Machine recognition of weevil damage in wheat radiographs
Pamela M. Keagy, Thomas F. Schatzki
Author Affiliations +
Proceedings Volume 1836, Optics in Agriculture and Forestry; (1993) https://doi.org/10.1117/12.144020
Event: Applications in Optical Science and Engineering, 1992, Boston, MA, United States
Abstract
An image processing algorithm has been developed for machine recognition of weevils and/or weevil damage in film x-ray images of wheat kernels [8 bits, (0.25 mm)2/pixel]. The 8 bit grey scale image is converted to a binary image of interior edges and lines using a Laplacian mask, zero threshold, and background removal. In undamaged kernels the predominant feature of this image is a line representing the central crease of the kernel. In insect-damaged kernels this feature is disrupted and additional edges or lines are seen at angles to the crease. The algorithm uses convolution masks to look for intersections (45 or 90 degree angles with 4 or 5 pixel length sides) at 8 orientations. Recognition varies with insect stage; at least 50% of infested kernels are machine recognized by the 4th instar (26 - 28 days). This is comparable to 50% recognition by humans at 25.5 days for images of similar resolution. False positive responses are limited to 0.5%.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pamela M. Keagy and Thomas F. Schatzki "Machine recognition of weevil damage in wheat radiographs", Proc. SPIE 1836, Optics in Agriculture and Forestry, (12 May 1993); https://doi.org/10.1117/12.144020
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Cited by 6 scholarly publications.
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KEYWORDS
Detection and tracking algorithms

X-rays

Agriculture

Forestry

Image processing

Image sensors

Radiography

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