Paper
30 April 1993 Highly accurate frequency counting system for 1.5-μm wavelength semiconductor lasers
Author Affiliations +
Proceedings Volume 1837, Frequency-Stabilized Lasers and Their Applications; (1993) https://doi.org/10.1117/12.143676
Event: Applications in Optical Science and Engineering, 1992, Boston, MA, United States
Abstract
For highly accurate optical frequency measurement in 1.5 micrometers wavelength region, an optical frequency comb (OFC) generator was realized by using a high frequency LiNbO3 electro-optic phase modulator which was installed in a Fabry-Perot cavity. By using the OFC generator, we demonstrated the frequency difference measurement up to 0.5 [THz] with a signal-to-noise ratio higher than 61 [dB], and the heterodyne optical phase locking with a heterodyne frequency of 0.5 [THz] in which the residual phase error variance was less than 0.01 [radian2]. The maximum measurable frequency difference, which was defined as a sideband frequency with the signal-to-noise ratio of 0 [dB], was estimated to be 4 [THz].
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Motonobu Kourogi, Kenichi Nakagawa, and Motoichi Ohtsu "Highly accurate frequency counting system for 1.5-μm wavelength semiconductor lasers", Proc. SPIE 1837, Frequency-Stabilized Lasers and Their Applications, (30 April 1993); https://doi.org/10.1117/12.143676
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Cited by 5 scholarly publications and 2 patents.
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KEYWORDS
Signal to noise ratio

Fabry–Perot interferometers

Crystals

Semiconductor lasers

Modulation

Mode locking

Optical testing

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