High-resolution x-ray studies of an AXAF high-energy transmission grating

Salim Abdali; Finn Erland Christensen; Herbert W. Schnopper; Thomas H. Markert; Daniel Dewey; Christie S. Nelson

doi:10.1117/12.167191

1 February 1994 High-resolution x-ray studies of an AXAF high-energy transmission grating

Salim Abdali, Finn Erland Christensen, Herbert W. Schnopper, Thomas H. Markert, Daniel Dewey, Christie S. Nelson

Proceedings Volume 2011, Multilayer and Grazing Incidence X-Ray/EUV Optics II; (1994) https://doi.org/10.1117/12.167191
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

A triple axis X-ray diffractometer, designed and built at the Danish Space Research Institute, was used to make a high resolution study of the performance of a 2000 angstroms period, high energy X-ray transmission grating developed at MIT for one of the grating spectrometers on the Advanced X-ray Astrophysics Facility. Data was obtained at CuK_(alpha )₁ (8.048 keV) and, using single reflection asymmetric Si(044) crystals for both the monochromator and analyzer, an angular resolution of 1.5 arcsec FWHM was achieved. The efficiency of the grating in all orders up to the 15th was measured using a 12 kW rotating anode X-ray generator. These data provided the basis for a modelling of the grating structure.

Citation Download Citation

Salim Abdali, Finn Erland Christensen, Herbert W. Schnopper, Thomas H. Markert, Daniel Dewey, and Christie S. Nelson "High-resolution x-ray studies of an AXAF high-energy transmission grating", Proc. SPIE 2011, Multilayer and Grazing Incidence X-Ray/EUV Optics II, (1 February 1994); https://doi.org/10.1117/12.167191

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