Bispectral identification and modeling analysis of clutter

Han-Ming Zhou; Zai-Lin Guan; Ya Wu; Shuzi Yang

doi:10.1117/12.156437

22 September 1993 Bispectral identification and modeling analysis of clutter

Han-Ming Zhou, Zai-Lin Guan, Ya Wu, Shuzi Yang

Proceedings Volume 2101, Measurement Technology and Intelligent Instruments; (1993) https://doi.org/10.1117/12.156437
Event: Measurement Technology and Intelligent Instruments, 1993, Wuhan, China

Abstract

In this paper, the alogrithm of bispectral consistent estimation is discussed, and it is applied to the identification of type Ix-4 lathe chatter phenanenon. Furthermore, for the data of chatter, a modelling analysis of threshold model and bilinear model is made.

Citation Download Citation

Han-Ming Zhou, Zai-Lin Guan, Ya Wu, and Shuzi Yang "Bispectral identification and modeling analysis of clutter", Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); https://doi.org/10.1117/12.156437

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available