New method of best-fitting on curved surface

Akira Kyusojin; Yoshinori Akimoto

doi:10.1117/12.156479

22 September 1993 New method of best-fitting on curved surface

Akira Kyusojin, Yoshinori Akimoto

Proceedings Volume 2101, Measurement Technology and Intelligent Instruments; (1993) https://doi.org/10.1117/12.156479
Event: Measurement Technology and Intelligent Instruments, 1993, Wuhan, China

Abstract

With the coordinates measuring machine the measured points are obtained as a series of points consist of the original feature and the deviations caused by misalignment i. e. translated deviation and angular deviation. To evaluate the form deviation accurately it is required to best-fit the measured feature to the ideal feature. Conventional best-fitting has been done to minimize the sum of squares of deviations between measured feature and ideal feature by translating and rotating the measured feature. It is possible for the curved line but too difficult for the curved surface. This paper gives a new method of best-fitting using datums which minimize the sum of squares in its normal direction. The datum is defined as straight line for the curved line and plane for the curved surface. When the datum of measured feature is coincided with that of the ideal feature the deviations caused by misslignment are eliminated. In order to confirm the reliability of this method computer simulations and practical measurements were made. Then close agreement was obtained. Key words: coordinate measuring machine best-fitting curved surface datum method of least-squares form deviation software on the measurement accuracy y C) - Measured feature . /Ideal feature -I. Fig. 1 Conventional bestfitting method Ideal Measured feature feature eviation a) curved line Fig. 2 Designation of form deviation 54 / SPIE Vol. 2101 Measurement Technology and Intelligent Instruments (1993) b) curved surface

Citation Download Citation

Akira Kyusojin and Yoshinori Akimoto "New method of best-fitting on curved surface", Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); https://doi.org/10.1117/12.156479

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available