Paper
30 August 1993 Construction of a nulling bridge-type dispersive interferometric spectrometer in the millimeter wave region
Author Affiliations +
Proceedings Volume 2104, 18th International Conference on Infrared and Millimeter Waves; 21042E (1993) https://doi.org/10.1117/12.2298518
Event: 18th International Conference on Infrared and Millimeter Waves, 1993, Colchester, United Kingdom
Abstract
A nulling bridge-type dispersive interferometric spectrometer has been constructed to measure complex refractiveindices of solids in the millimeter wave region. The complex refractive indices of doped Si and GaAs wafers are obtained in the110 - 170 GHz region and their dispersion is analyzed based on the Drude model. The electrical resistivity estimated from theDrude-model fitting agrees well with that measured by the dc four-point probe method.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Masanori Hangyo "Construction of a nulling bridge-type dispersive interferometric spectrometer in the millimeter wave region", Proc. SPIE 2104, 18th International Conference on Infrared and Millimeter Waves, 21042E (30 August 1993); https://doi.org/10.1117/12.2298518
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KEYWORDS
Spectroscopy

Interferometry

Refractive index

Extremely high frequency

Semiconducting wafers

Silicon

Mirrors

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