ZnSe quality analysis by x-ray luminescence

A. A. Artamonova; V. Ya. Degoda; V. E. Rodionov

doi:10.1117/12.191974

31 October 1994 ZnSe quality analysis by x-ray luminescence

A. A. Artamonova, V. Ya. Degoda, V. E. Rodionov

Proceedings Volume 2113, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1994) https://doi.org/10.1117/12.191974
Event: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics: International Workshop, 1993, Kiev, Ukraine

Abstract

The x-ray luminescence of the unintentionally doped polycrystalline ZnSe samples has been studied at the wide spectral range. Comparative study of x-ray luminescence and photoluminescence spectra has been made. The analysis of purity and quality of ZnSe by x-ray luminescent measurements is advantageous because of the bulk character of the x-ray excitation and the possibility of testing big squares. The peculiar features of x-ray spectra of unintentionally doped ZnSe lead us to conclude that this material has high optical quality.

Citation Download Citation

A. A. Artamonova, V. Ya. Degoda, and V. E. Rodionov "ZnSe quality analysis by x-ray luminescence", Proc. SPIE 2113, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (31 October 1994); https://doi.org/10.1117/12.191974

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