Paper
1 April 1994 Yield enhancement: photomask pellicles for use in flat panel display lithography
Gilbert Hong, Patrick St. Cin
Author Affiliations +
Proceedings Volume 2174, Advanced Flat Panel Display Technologies; (1994) https://doi.org/10.1117/12.172153
Event: IS&T/SPIE 1994 International Symposium on Electronic Imaging: Science and Technology, 1994, San Jose, CA, United States
Abstract
Pellicles have been used on photomasks in the semiconductor industry for the past ten years as a means to enhance wafer yields. An overview of pellicle technology and yield improvements for the semiconductor industry will be presented. Single die reticles are used in both the semiconductor and display lithography; similar and dissimilar aspects of the use of pellicles between these two industries will be presented. The application of pellicles specific to display lithography will be presented as a means of enhancing yields.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gilbert Hong and Patrick St. Cin "Yield enhancement: photomask pellicles for use in flat panel display lithography", Proc. SPIE 2174, Advanced Flat Panel Display Technologies, (1 April 1994); https://doi.org/10.1117/12.172153
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Pellicles

Lithography

Particles

Photomasks

Semiconducting wafers

Manufacturing

Flat panel displays

RELATED CONTENT

e beam direct write why it's always left standing...
Proceedings of SPIE (March 19 2018)
Designing to win in sub-90nm mask production
Proceedings of SPIE (November 07 2005)
Pellicle-induced distortions on photomasks
Proceedings of SPIE (September 01 1998)
Impact of OPC aggressiveness on mask manufacturability
Proceedings of SPIE (August 28 2003)
Sizing the next generation of optical photomasks
Proceedings of SPIE (July 03 1995)

Back to Top