Paper
30 September 1994 Spectroscopic imaging of atmospheric-pressure helium inductively coupled plasma (ICP) discharges
Akbar Montaser, Anna-Lisa M. Boyes, Mingxiang Cai, Chunming Hsiech, Hao Zhang
Author Affiliations +
Abstract
Spatially resolved information from atmospheric-pressure helium inductively coupled plasmas (He ICP) was acquired with a simple, inexpensive optical imaging spectrometer. The system uses a 35-cm focal length Czerny-Turner monochromator/spectrograph and a solid state charge-injection device (CID) or a charge coupled device (CCD). Quantitative image maps of the plasmas were produced with good resolution. For example, when the CID was used, the entire plasma image could be monitored with a spatial resolution of 0.13 and 0.10 mm in the horizontal and vertical directions. The spectral resolution was 4 nm. Lateral distributions of emission intensities were converted, using an Abel inversion routine, to radial distributions. Some unique features of the He ICP, compared to the commonly used Ar ICP, were identified at or around analytical conditions for elemental analysis of gaseous and aqueous samples.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Akbar Montaser, Anna-Lisa M. Boyes, Mingxiang Cai, Chunming Hsiech, and Hao Zhang "Spectroscopic imaging of atmospheric-pressure helium inductively coupled plasma (ICP) discharges", Proc. SPIE 2266, Optical Spectroscopic Techniques and Instrumentation for Atmospheric and Space Research, (30 September 1994); https://doi.org/10.1117/12.187590
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Plasmas

Argon

Helium

Spectroscopy

Charge-coupled devices

Sensors

Image processing

RELATED CONTENT

Hot-metal detectors and crop shear optimization
Proceedings of SPIE (September 22 1993)
Design of wide field and high resolution video lens
Proceedings of SPIE (November 20 2009)
SCREEN photometric property detection system based on area CCD
Proceedings of SPIE (September 08 2011)
Correction of CCD sensor noise
Proceedings of SPIE (July 08 2003)
A new method for measuring the position of the end...
Proceedings of SPIE (July 11 2008)

Back to Top