Paper
11 November 1994 Characterization of concave-curved diffractors for spectrometers in 2D x-ray optical instrumentations
William Z. Chang, O. Wehrhan, Eckhart Foerster, Felix N. Chukhovskii
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Abstract
Characterization of bent crystals used in x-ray spectroscopic instrumentation is carried out, which includes different methods for measuring the reflection curves of bent crystals and integrated reflectivities. The integrated reflectivities of a cylindrically bent PET crystal within the wavelength range of 0.3 - 0.8 nm are presented. The measured data are compared with calculations using both kinematic and dynamic theories. Based upon the x-ray dynamic theory of bent crystals, the optimal selection of the x-ray wavelength, crystal reflections and bending radius, which are necessary to observe the fine details of the reflection curve, are determined. To obtain both the energy band and the angular width of the probing beam in the order of 10-5 radian, a double-crystal spectrometer in a dispersive configuration, which consists of quartz (20.3) symmetric and silicon (111) asymmetric reflections, is suggested. As a result, the former has a nearly normal incident case, which makes possible a (Delta) (lambda) /(lambda) value of approximate 2 X 10-5; the latter reflection contributes mainly to the reduction of the angular width of the diffracted beam. A rotating device with high angular precision to measure the reflection curve is discussed.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
William Z. Chang, O. Wehrhan, Eckhart Foerster, and Felix N. Chukhovskii "Characterization of concave-curved diffractors for spectrometers in 2D x-ray optical instrumentations", Proc. SPIE 2279, Advances in Multilayer and Grazing Incidence X-Ray/EUV/FUV Optics, (11 November 1994); https://doi.org/10.1117/12.193155
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KEYWORDS
Crystals

Reflection

X-rays

Reflectivity

Laser crystals

Spectrometers

Silicon

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