Method to increase brightness of the tapered fiber probe for scanning near-field optical microscope

Pei-Kuen Wei; Wunshain S. Fann

doi:10.1117/12.205927

30 March 1995 Method to increase brightness of the tapered fiber probe for scanning near-field optical microscope

Pei-Kuen Wei, Wunshain S. Fann

Proceedings Volume 2384, Scanning Probe Microscopies III; (1995) https://doi.org/10.1117/12.205927
Event: Photonics West '95, 1995, San Jose, CA, United States

Abstract

We present a new method to improve the brightness of tapered fiber probes for near-field scanning optical microscope. The new probes are fabricated by adding high refractive index materials onto the pulled tapered fiber tips before coated with metal. With a tip size of 100 nm, the far-field optical power of the new tapered probe which has 25 nm thickness of zinc sulfide on tip end is about 5 times larger than the same sized traditional fiber probe.

Citation Download Citation

Pei-Kuen Wei and Wunshain S. Fann "Method to increase brightness of the tapered fiber probe for scanning near-field optical microscope", Proc. SPIE 2384, Scanning Probe Microscopies III, (30 March 1995); https://doi.org/10.1117/12.205927

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