Method for characterization of film thickness and refractive index in volume holographic materials

Sylvia H. Stevenson; Kirk W. Steijn

doi:10.1117/12.205352

23 March 1995 Method for characterization of film thickness and refractive index in volume holographic materials

Sylvia H. Stevenson, Kirk W. Steijn

Proceedings Volume 2405, Holographic Materials; (1995) https://doi.org/10.1117/12.205352
Event: Photonics West '95, 1995, San Jose, CA, United States

Abstract

Independent characterization of changes in film thickness and refractive index is necessary for accurate prediction of the Bragg playback conditions of volume holograms after processing. We have developed a method which uses weak holographic mirrors to characterize processing- induced swelling or shrinkage and index change in volume holographic films, and have applied this method to DuPont OmniDex^TM holographic recording films. Results of these measurements are presented.

Citation Download Citation

Sylvia H. Stevenson and Kirk W. Steijn "Method for characterization of film thickness and refractive index in volume holographic materials", Proc. SPIE 2405, Holographic Materials, (23 March 1995); https://doi.org/10.1117/12.205352

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