Paper
30 June 1995 High-speed rail flaw pattern recognition and classification
R. Mark Havira, Jinzhu Chen
Author Affiliations +
Abstract
A real time system for automated rail inspection and flaw classification at speeds up to 25 mph is described. To maintain a fast testing rate, a distributed multiple processor configuration is used for the high speed portion of the system. A graphics computer provides for real time visualization and playback analysis in a modified B-Scan format. A hierarchical approach is used to distribute the total pattern recognition task into a set of stages in which the recognition results at one stage provide input data of the next stage.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Mark Havira and Jinzhu Chen "High-speed rail flaw pattern recognition and classification", Proc. SPIE 2458, Nondestructive Evaluation of Aging Railroads, (30 June 1995); https://doi.org/10.1117/12.212690
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Pattern recognition

Computing systems

Ultrasonics

Visualization

Control systems

Data storage

Feature extraction

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