Microwave Tower Deflection Monitor

Bruce E. Truax

doi:10.1117/12.959396

31 October 1980 Microwave Tower Deflection Monitor

Bruce E. Truax

Proceedings Volume 0247, Advances in Laser Engineering and Applications; (1980) https://doi.org/10.1117/12.959396
Event: 24th Annual Technical Symposium, 1980, San Diego, United States

Abstract

This paper describes an instrument which is capable of monitoring both the twist and lateral motion of a microwave tower. The Microwave Tower Deflection Monitor (MTDM) gives designers the capability of evaluating towers, both for troubleshooting purposes and comparison with design theory. The MTDM has been designed to operate on a broad range of tower structures in a variety of weather conditions. The instrument measures tower motion by monitoring the position of two retroreflectors mounted on the top of the tower. The two retroreflectors are located by scanning a laser beam in a raster pattern in the vicinity of the reflector. When a retroreflector is struck its position is read by a microprocessor and stored on a magnetic tape. Position resolution of better than .5 cm at 200 ft. has been observed in actual tests.

Citation Download Citation

Bruce E. Truax "Microwave Tower Deflection Monitor", Proc. SPIE 0247, Advances in Laser Engineering and Applications, (31 October 1980); https://doi.org/10.1117/12.959396

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