Wideband infrared scene projector (WISP)

Anne M. Carstens; Robert G. Stockbridge; James E. Dillon

doi:10.1117/12.210547

30 May 1995 Wideband infrared scene projector (WISP)

Anne M. Carstens, Robert G. Stockbridge, James E. Dillon

Proceedings Volume 2474, Smart Focal Plane Arrays and Focal Plane Array Testing; (1995) https://doi.org/10.1117/12.210547
Event: SPIE's 1995 Symposium on OE/Aerospace Sensing and Dual Use Photonics, 1995, Orlando, FL, United States

Abstract

Advanced infrared (IR) guided weapons, such as Theater High Altitude Area Defense and AGM 65, require a robust multispectral IR hardware-in-the-loop testing capability for high fidelity performance characterization and pre-flight and post-flight evaluation. The Kinetic Kill Vehicle Hardware-in-the-Loop Simulator facility, Munition Seeker and Evaluation Technology Branch (WL/MNGI), Eglin AFB, FL, provides the capability for the non-destructive performance testing of precision guided munition systems and subsystems. Particularly challenging is the development of scene projectors to stimulate IR imaging seekers with inband photons as an element of hardware-in-the-loop (closed-loop) guidance and control tests. IR scene projectors currently have limitations in radiometric power, resolution, response time, spectral band coverage, flicker control, and uniformity. Although today's projectors have overcome some of these limitations, the advances have been achieved through technology trades such as flicker control and spectral band coverage in laser projectors and radiometric power, flicker control and response time in the liquid crystal light valve projectors. WL/MNGI is developing a spectrally tailorable IR scene projector under the WISP program that overcomes the need for the limiting trades of the past, providing the most robust and flexible design to date.

Citation Download Citation

Anne M. Carstens, Robert G. Stockbridge, and James E. Dillon "Wideband infrared scene projector (WISP)", Proc. SPIE 2474, Smart Focal Plane Arrays and Focal Plane Array Testing, (30 May 1995); https://doi.org/10.1117/12.210547

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