Characterization Of Scattering From Diamond-Turned Surfaces

Steven R Lange; Robert E. Parks

doi:10.1117/12.959613

3 March 1981 Characterization Of Scattering From Diamond-Turned Surfaces

Steven R Lange, Robert E. Parks

Proceedings Volume 0257, Radiation Scattering in Optical Systems; (1981) https://doi.org/10.1117/12.959613
Event: 1980 Huntsville Technical Symposium, 1980, Huntsville, United States

Abstract

Methods of characterizing t roughness of and scattering from plane single-point diamond-turned surfaces include Nomarski mlcroscopy, microscopic double-beam and multiple-beam interferometry, mechanical profilometry, normalized scatter, and BRDF measurements. Size and curvature parameters limit the usefulness of some of these techniques in the study of nonflat, real-life hardware. A nartial solution to the problems of characterizing curved surfaces is t use replication methods. Polishing reduces the surface roughness and scattering from nonflat single-point diamond-turned surfaces.

Citation Download Citation

Steven R Lange and Robert E. Parks "Characterization Of Scattering From Diamond-Turned Surfaces", Proc. SPIE 0257, Radiation Scattering in Optical Systems, (3 March 1981); https://doi.org/10.1117/12.959613

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