Photoreflectance characterization on GaAs/AlGaAs optical waveguides of multiple quantum-well structure

Gwo-Jen Jan; Yu-Yuan Tai; Kuo-Tung Hsu

doi:10.1117/12.226204

3 November 1995 Photoreflectance characterization on GaAs/AlGaAs optical waveguides of multiple quantum-well structure

Gwo-Jen Jan, Yu-Yuan Tai, Kuo-Tung Hsu

Proceedings Volume 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1995) https://doi.org/10.1117/12.226204
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1995, Kiev, Ukraine

Abstract

Two GaAs/AlGaAs passive semiconductor channel waveguides of the multiple quantum well structure have been made by molecular beam epitaxial growth technique. The specimens were studied by photoreflectance (PR) spectroscopy at room temperature. The micro-structures of the PR spectral energy features on the layers of the multiple quantum wells and band edge transition were observed. The optical transition energy features were fitted by the first derivative Gaussian function form (GFF) and the peak positions of the theoretical prediction for the micro-structures were calculated by using effective mass envelope function model. The energy features of the micro-structure in PR spectra were identified and interpreted. The results show that PR is a powerful tool to characterize the optical waveguides of multiple quantum well structure.

Citation Download Citation

Gwo-Jen Jan, Yu-Yuan Tai, and Kuo-Tung Hsu "Photoreflectance characterization on GaAs/AlGaAs optical waveguides of multiple quantum-well structure", Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); https://doi.org/10.1117/12.226204

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