Carrier distributions and leakage in (AlGa)InP visible emitting lasers

Peter Blood; Peter M. Smowton; Damian Foulger

doi:10.1117/12.237645

12 April 1996 Carrier distributions and leakage in (AlGa)InP visible emitting lasers

Peter Blood, Peter M. Smowton, Damian Foulger

Proceedings Volume 2682, Laser Diodes and Applications II; (1996) https://doi.org/10.1117/12.237645
Event: Photonics West '96, 1996, San Jose, CA, United States

Abstract

We have examined the distribution of carriers between well and barrier in 670 nm GaInP lasers by recording spontaneous emission spectra at threshold as a function of temperature through a top contact window. Assuming the bands in the active region of wells and barrier to be flat at threshold we find that these carrier populations are well described by common quasi- Fermi levels and a carrier temperature equal to the lattice temperature. The activation energy of the thermally activated leakage current at threshold agrees well with that predicted on a flat- band model for the loss of electrons through the X conduction band minima. A self-consistent simulation of the carrier distribution through the complete laser structure at threshold shows that a flat-band model is a reasonable approximation over the range of temperatures (200 K - 400 K) and for the structures considered in this work.

Citation Download Citation

Peter Blood, Peter M. Smowton, and Damian Foulger "Carrier distributions and leakage in (AlGa)InP visible emitting lasers", Proc. SPIE 2682, Laser Diodes and Applications II, (12 April 1996); https://doi.org/10.1117/12.237645

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