Residual stress contribution to fracture of ferroelectric ceramics

Christopher S. Lynch

doi:10.1117/12.240846

31 May 1996 Residual stress contribution to fracture of ferroelectric ceramics

Christopher S. Lynch

Proceedings Volume 2715, Smart Structures and Materials 1996: Mathematics and Control in Smart Structures; (1996) https://doi.org/10.1117/12.240846
Event: 1996 Symposium on Smart Structures and Materials, 1996, San Diego, CA, United States

Abstract

Experiments based on the Vicker's indentation technique are applied to a ferroelectric and a relaxor composition of lead lanthanum zirconate titanate. When polarized, the ferroelectric composition displays anisotropic crack growth. The anisotropy in crack growth is affected by electric field. Increasing the electric field increases the crack growth perpendicular to the field direction. The relaxor composition displays nearly isotropic crack growth even under electric field. Application of electric field slightly hinders crack growth perpendicular to the field. As the field level is increased, this effect diminishes. The effect appears to be related to intergranular residual stress.

Citation Download Citation

Christopher S. Lynch "Residual stress contribution to fracture of ferroelectric ceramics", Proc. SPIE 2715, Smart Structures and Materials 1996: Mathematics and Control in Smart Structures, (31 May 1996); https://doi.org/10.1117/12.240846

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available