Paper
10 June 1996 In-plane deformation measurement by digital phase-shifting speckle interferometry
V. I. Gushov, V. G. Nechaev
Author Affiliations +
Proceedings Volume 2791, Photomechanics '95; (1996) https://doi.org/10.1117/12.242108
Event: Photomechanics '95, 1995, Novosibirsk, Russian Federation
Abstract
Digital speckle-pattern interferometry systems for automatic measurement of in-plane deformation of a diffuse object are presented, based on phase shifting of a speckle interferogram. Before deformation, three digital speckle patterns are recorded as changing the phase of reference light such as 0,pi/4, pi/2. After deformation, three digital speckle patterns are recorded with phase shifts - pi/2, 3pi/4, pi, respectively. A calculation of the arctangent with phase-shifted speckle pattern gives the optical path difference which is proportional to the deformation.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
V. I. Gushov and V. G. Nechaev "In-plane deformation measurement by digital phase-shifting speckle interferometry", Proc. SPIE 2791, Photomechanics '95, (10 June 1996); https://doi.org/10.1117/12.242108
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KEYWORDS
Phase shifts

Speckle

Speckle pattern

Argon

Digital recording

Cameras

Speckle interferometry

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