Reducing track errors caused by rotating micrometer tips

Alson E. Hatheway

doi:10.1117/12.259034

20 November 1996 Reducing track errors caused by rotating micrometer tips

Alson E. Hatheway

Proceedings Volume 2865, Actuator Technology and Applications; (1996) https://doi.org/10.1117/12.259034
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

This paper describes research on a new mechanism to reduce undesirable cross-track motions in precision mechanisms driven by lead screws and micrometer heads. The discussion includes an analysis of the forces between a driving micrometer tip and a driven carriage, the forces which generate the undesirable cross-track motions of the carriage. Test data from a typical mechanism are presented. A novel machine element is proposed to reduce these forces and their effects. The mechanisms was modified to incorporate the element and laboratory test data are presented corroborating the analysis, showing the anticipated reduction in the cross-track motions in the mechanism.

Citation Download Citation

Alson E. Hatheway "Reducing track errors caused by rotating micrometer tips", Proc. SPIE 2865, Actuator Technology and Applications, (20 November 1996); https://doi.org/10.1117/12.259034

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