Paper
27 February 1997 Residual-stress determination by means of neuron diffraction
Henry J. Prask, Paul C. Brand
Author Affiliations +
Proceedings Volume 2867, International Conference Neutrons in Research and Industry; (1997) https://doi.org/10.1117/12.267879
Event: Fifth International Conference on Applications of Nuclear Techniques: Neutrons in Research and Industry, 1996, Crete, Greece
Abstract
Neutron diffraction is becoming an increasingly important tool for the determination of triaxial residual stress distributions for materials science and engineering applications. Indeed, virtually all of the major neutron centers in the world have, or are planning, programs in this area. In this paper the basic principles of the technique will be described, along with advantages and limitations relative to other nondestructive residual stress measurement methods. Examples of the application of the technique to sub-surface residual stress determination in metals and composites will be presented, along with some near-surface results. The significant features of new neutron instruments for residual stress study will be summarized.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Henry J. Prask and Paul C. Brand "Residual-stress determination by means of neuron diffraction", Proc. SPIE 2867, International Conference Neutrons in Research and Industry, (27 February 1997); https://doi.org/10.1117/12.267879
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Cited by 8 scholarly publications.
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KEYWORDS
Diffraction

Composites

Interfaces

Nondestructive evaluation

X-ray diffraction

Silicon carbide

Aluminum

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