Paper
6 June 1997 Experimental study of physical parameters of semiconductor lasers
Gleb E. Shtengel, Paul A. Morton, Rudolf F. Kazarinov, David A. Ackerman, Mark S. Hybertsen, Gregory L. Belenky, C. Lewis Reynolds Jr.
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Abstract
We discuss various experimental methods for measurements of the optical gain, transparency wavelength and optical loss. We discuss existing methods as well as newly developed. It is also shown how this set of measurements allows for characterization of other laser parameters, such as linewidth enhancement factor, differential gain, and wavelength chirp. We illustrate how these techniques are used for improving the laser performance for different applications.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gleb E. Shtengel, Paul A. Morton, Rudolf F. Kazarinov, David A. Ackerman, Mark S. Hybertsen, Gregory L. Belenky, and C. Lewis Reynolds Jr. "Experimental study of physical parameters of semiconductor lasers", Proc. SPIE 2994, Physics and Simulation of Optoelectronic Devices V, (6 June 1997); https://doi.org/10.1117/12.275618
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Cited by 5 scholarly publications.
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KEYWORDS
Refractive index

Optical testing

Semiconductor lasers

Transparency

Mirrors

Absorption

Temperature metrology

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