Paper
30 April 1998 Sum-frequency generation spectroscopy in the mid-infrared: K-doped C60/Ag (111) interface
Andre Peremans, Y. Caudano, Paul Dumas, Wan Quan Zheng, A. Le Rille, Paul A. Thiry, Abderrahmane Tadjeddine
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Abstract
We have developed a Sum-Frequency Generation (SFG) spectrometer allowing sensitive and highly resolved (1.8 cm-1) vibrational spectroscopy in the mid-infrared (2 - 10 micrometers ) using a dedicated picosecond optical parametric oscillator. Combining SFG and infrared absorption-reflection spectroscopy, we pinpoint the occurrence of dynamical charge transfer at the C60/Ag(111) interface. The induced strong infrared activation of the C60 Ag(2) mode (approximately 1445 cm-1) and its softening are quenched upon K-doping. This allows us to infer the coupling strength of the Ag(2) vibration to the t1u orbital of C60.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andre Peremans, Y. Caudano, Paul Dumas, Wan Quan Zheng, A. Le Rille, Paul A. Thiry, and Abderrahmane Tadjeddine "Sum-frequency generation spectroscopy in the mid-infrared: K-doped C60/Ag (111) interface", Proc. SPIE 3272, Laser Techniques for Surface Science III, (30 April 1998); https://doi.org/10.1117/12.307139
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Cited by 3 scholarly publications.
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KEYWORDS
Infrared radiation

Spectroscopy

Optical parametric oscillators

Infrared spectroscopy

Raman spectroscopy

Interfaces

Picosecond phenomena

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