Paper
1 April 1998 Two-dimensional two-step Fourier spectrum analysis for similar-image identification
Author Affiliations +
Proceedings Volume 3314, Optical Security and Counterfeit Deterrence Techniques II; (1998) https://doi.org/10.1117/12.304681
Event: Photonics West '98 Electronic Imaging, 1998, San Jose, CA, United States
Abstract
In this report the method of the analysis of two similar structures is discussed. The structures to be compared are considered as two dimensional, amplitude only and are composed by identical apertures. The difference between theses structures is connected with spatial position of the one or several apertures. This difference can be found by: (1) comparison of the two secondary Fourier spectra (auto- correlation signals) of corresponding transmittance functions, and (2) comparison of the cross-correlation signal and the first auto-correlation signal. In that case, we can describe directly the second structure. So, the knowledge of the structures is possible even though we do not know apriory the structures. Some experimental and computer simulated results applied to pattern recognition are presented.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vladimir B. Markov and Yobani Mejia "Two-dimensional two-step Fourier spectrum analysis for similar-image identification", Proc. SPIE 3314, Optical Security and Counterfeit Deterrence Techniques II, (1 April 1998); https://doi.org/10.1117/12.304681
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KEYWORDS
Transmittance

Computer simulations

Spectrum analysis

Convolution

Diffraction

Image analysis

Pattern recognition

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