Ionically self-assembled second-order nonlinear optical thin film materials and devices

Yanjing Liu; Youxiong Wang; Wei Zhao; Richard O. Claus; Kevin Lenehan; James Randy Heflin

doi:10.1117/12.316960

21 July 1998 Ionically self-assembled second-order nonlinear optical thin film materials and devices

Yanjing Liu, Youxiong Wang, Wei Zhao, Richard O. Claus, Kevin Lenehan, James Randy Heflin

Proceedings Volume 3330, Smart Structures and Materials 1998: Sensory Phenomena and Measurement Instrumentation for Smart Structures and Materials; (1998) https://doi.org/10.1117/12.316960
Event: 5th Annual International Symposium on Smart Structures and Materials, 1998, San Diego, CA, United States

Abstract

We report that anew ionically self-assembled monolayer (ISAM) method for thin-film deposition can be employed to fabricate materials possessing the noncentrosymmetry that is required for a second order, (Chi) (²), nonlinear optical response. Using several different commercially- available polyelectrolytes and additional precursors designed and fabricated in our laboratories, we have produced ISAM nonlinear optical thin films with (Chi) (²) films self-assemble into a noncentrosymmetric structure that has exhibited no measurable decay of (Chi) (²) at room temperature over a period of more than four months. The (Chi) (²) of ISAM thin-films has been examined by second harmonic generation using a fundamental wavelength of 1200 nm. The second harmonic intensity of the films exhibits the expected quadratic consistent with orientation of the chromophobe dipole moment perpendicular to the substrate. We describe the potential application of such NLO thin-film materials in field sensing elements and support instrumentation systems.

Citation Download Citation

Yanjing Liu, Youxiong Wang, Wei Zhao, Richard O. Claus, Kevin Lenehan, and James Randy Heflin "Ionically self-assembled second-order nonlinear optical thin film materials and devices", Proc. SPIE 3330, Smart Structures and Materials 1998: Sensory Phenomena and Measurement Instrumentation for Smart Structures and Materials, (21 July 1998); https://doi.org/10.1117/12.316960

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