Electromagnetic microscope compared with a conventional pulsed eddy-current probe

Walter N. Podney

doi:10.1117/12.305058

31 March 1998 Electromagnetic microscope compared with a conventional pulsed eddy-current probe

Walter N. Podney

Proceedings Volume 3397, Nondestructive Evaluation of Aging Aircraft, Airports, and Aerospace Hardware II; (1998) https://doi.org/10.1117/12.305058
Event: Non-Destructive Evaluation Techniques for Aging Infrastructure and Manufacturing, 1998, San Antonio, TX, United States

Abstract

A superconductive probe presently can detect a crack at a rivet hole that is two to three times smaller than the smallest crack detectable by a conventional probe. As the technology matures and noise resolution approaches a limit set by SQUIDS, approximately 1 fH, it will enable detecting submillimeter cracks down to approximately 15 mm.

Citation Download Citation

Walter N. Podney "Electromagnetic microscope compared with a conventional pulsed eddy-current probe", Proc. SPIE 3397, Nondestructive Evaluation of Aging Aircraft, Airports, and Aerospace Hardware II, (31 March 1998); https://doi.org/10.1117/12.305058

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