Optical peculiarities of thin absorbing films

Tamara A. Kudykina

doi:10.1117/12.320957

19 August 1998 Optical peculiarities of thin absorbing films

Tamara A. Kudykina

Proceedings Volume 3573, OPTIKA '98: 5th Congress on Modern Optics; (1998) https://doi.org/10.1117/12.320957
Event: OPTIKA '98: Fifth Congress on Modern Optics, 1998, Budapest, Hungary

Abstract

Optical parameters of thin semiconductor films in visible region are investigated with two different methods: use the new analogues of Fresnel's formulas for absorbing media for calculation of reflection and transmission and, use the calculation of an index of refraction on a base of a phase change on reflection. Results of these methods agree well. Thickness dependencies of n(d) and k(d) of Ge, Si, Se, Te were obtained for the experimental data. Curves n(d) have resonance maxima at thicknesses, which are less than light wavelength in a medium in (pi) times. Curves k(d) in this region have minima or even change their signs showing that both absorption and spontaneous emission of light take place. In the limit d yields 0, n(d) trends to unity.

Citation Download Citation

Tamara A. Kudykina "Optical peculiarities of thin absorbing films", Proc. SPIE 3573, OPTIKA '98: 5th Congress on Modern Optics, (19 August 1998); https://doi.org/10.1117/12.320957

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